Optics: measuring and testing – By particle light scattering – With photocell detection
Patent
1996-09-10
2000-02-01
Kim, Robert H.
Optics: measuring and testing
By particle light scattering
With photocell detection
356345, G01B 902
Patent
active
060209623
ABSTRACT:
By considering a transient signal as merely another signal in a linear, shift-invariant system representing a step-scanning Fourier transform spectrometer, the present invention characterizes the transient signal and then compensates for its effect on the measurement by employing various signal processing techniques. Thus, according to one aspect of the present invention, it provides a method for obtaining the spectrum of the desired signal by subtracting the Fourier transform of the transient signal from the Fourier transform of the composite signal output from the detector (i.e., the signal containing both the desired signal and the transient signal).
According to another aspect of the present invention, it provides a method for deriving an estimate of the Fourier transform of the transient signal from the Fourier transform of the composite signal.
REFERENCES:
patent: 5612784 (1997-03-01), Curbelo
Manning, Christopher J. et al., "Step-scanning interferometer with digital signal processing," Applied Spectroscopy, vol. 47(9), 1993, pp. 1345-1349.
Rubinovitz, R. et al., "Step-scan technique for middle infrared spectroscopy," FT-IR, pp. 35-38.
Smith, Matthew J., "Step scan interferometry in the mid-infrared with photothermal detection," Applied Spectroscopy, vol. 41(4), 1998, pp. 546-555.
Bio-Rad Laboratories, Inc.
Kim Robert H.
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