Digital signal analysis program and waveform display apparatus

Details Digital signal analysis program and waveform display apparatus Digital signal analysis program and waveform display apparatus

2007-03-22

2010-06-01

Wachsman, Hal D (Department: 2857)

Data processing: measuring, calibrating, or testing

Measurement system in a specific environment

Electrical signal parameter measurement system

C702S066000, C702S069000, C375S226000

Reexamination Certificate

active

07729872

ABSTRACT:
Selectable portions of a display on a display screen allow a user to select bits of a digital signal. A mode selection menu changes the bit selection to select bits in different ways. If an individual bit designation mode is selected, objects are displayed that correspond to the respective bits of the digital signal. A user selects the object corresponding to a desired bit by use of a mouse. After bit selection, an eye pattern, derived from only selected bits, is displayed. Additionally, jitter analysis results derived from only the selected bits are displayed.

REFERENCES:
patent: 6806877 (2004-10-01), Fernando
patent: 6810346 (2004-10-01), Nygaard et al.
patent: 6934647 (2005-08-01), MacDonald
patent: 2004/0153266 (2004-08-01), Nygaard, Jr.
patent: 2006/0182205 (2006-08-01), Draving et al.

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