Digital Q control for enhanced measurement capability in...

Details Digital Q control for enhanced measurement capability in... Digital Q control for enhanced measurement capability in...

2008-06-17

2008-06-17

Larkin, Daniel S (Department: 2856)

Measuring and testing

Surface and cutting edge testing

Roughness

C700S280000

Reexamination Certificate

active

07387017

ABSTRACT:
A digital system for controlling the quality factor in a resonant device. The resonant device can be any mechanically driven resonant device, but more particularly can be a device that includes a cantilever within its system, such as an atomic force microscope. The quality factor can be digitally controlled to avoid noise effect in the analog components. One of the controls can use a direct digital synthesizer implemented in a way that provides access to the output of the phase accumulator. That output drives a lookup table to produce a cosine or sine output wave. The output is also formed into a second number that drives a second lookup table to create an adjustment factor. The adjusted digital signal then drives a DA converter which produces an output drive for the cantilever.

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