Digital processing system with self-test capability

Details Digital processing system with self-test capability Digital processing system with self-test capability

1982-08-30

1985-05-21

Atkinson, Charles E.

Excavating

364737, 371 25, G06F 1100

Patent

active

045190771

ABSTRACT:
A digital processing system includes a memory for the storage of both data and instructions of M binary digit widths a N (N.noteq.M) binary digit parallel arithmetic and logic unit and self-test circuitry connected to the memory and connected to the arithmetic and logic unit for summing the numeric value of the contents of the memory into a set of sums that are N binary digit width and for comparing these sums with corresponding checksum constants to determine the integrity of the instructions stored in memory and the integrity of the arithmetic and logic unit operation.

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Rosenfeld, Variable-width Adder for Microprogrammed Computers used for Emulation, IBM Technical Disclosure Bulletin, vol. 15, No. 4, Sep. 1972, pp. 1149-1150.

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