Digital parallel electron beam lithography stamp

Radiant energy – Irradiation of objects or material – Irradiation of semiconductor devices

Reexamination Certificate

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C250S492100, C250S492200, C250S492230, C250S492300

Reexamination Certificate

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07425715

ABSTRACT:
An array of vertically aligned electron emitting nanotips such as multiwall carbon nanotubes are formed for use as a lithographic stamp. Crosswire addressing is used to generate electron emission from particular nanotips within the array. The nanotip array may be used to cure a resist, produce localized electrochemical reactions, establish localized electrostatic charge distributions, or perform other desirable coating or etching process steps so as to create nanoelectronic circuitry or to facilitate molecular or nanoscale processing.

REFERENCES:
patent: 4896044 (1990-01-01), Li et al.
patent: 4968390 (1990-11-01), Bard et al.
patent: 5047649 (1991-09-01), Hodgson et al.
patent: 5412641 (1995-05-01), Shinjo et al.
patent: 5973444 (1999-10-01), Xu et al.
patent: 6283812 (2001-09-01), Jin et al.
patent: 6504292 (2003-01-01), Choi et al.
patent: 6538367 (2003-03-01), Choi et al.
patent: 6660959 (2003-12-01), Vallance et al.
patent: 6864162 (2005-03-01), Jin
patent: 6885010 (2005-04-01), Traynor et al.
patent: 6899854 (2005-05-01), Darty
patent: 6917043 (2005-07-01), Thomas et al.
patent: 6962515 (2005-11-01), Dean et al.
patent: 6982519 (2006-01-01), Guillorn et al.
patent: 7011927 (2006-03-01), Iwamatsu
patent: 7012266 (2006-03-01), Jin
patent: 2002/0182542 (2002-12-01), Choi et al.
patent: 2003/0102444 (2003-06-01), Deppert et al.
patent: 2003/0209676 (2003-11-01), Loschner et al.
patent: 2004/0036398 (2004-02-01), Jin
patent: 2004/0140432 (2004-07-01), Maldonado et al.
patent: 2006/0118735 (2006-06-01), Kim et al.
patent: 2007/0279334 (2007-12-01), Mouttet
Mesquida et al., Maskless nanofabrication using the electrostatic attachment of gold particles to electrically patterned surfaces, Microelectronics Engineering, 2002, 671-674.
Lim et al., Electrostatically Driven Dip-Pen Nanolithography of Conducting Polymers, Advanced Materials, Adv. Materials, 2002, 1474-1477.
Suh et al., Study of the field-screening effect of highly ordered carbon nanotube arrays, Applied Physics Letters, 2002, 2392-2394.
Jeong et al., Fabrication of the aligned and patterned carbon nanotube field emitters using the anodic aluminum oxide nano-template on a Si wafer,Synthetic Metals,2003,385-390.
Kim et al., Growth of carbon nanotubes with anodic aluminum oxide formed on the catalytic metal-coated Si substrate, Diamond and Related Materials, 2003, 870-873.
Akita et al., Length Adjustment of Carbon Nanotube Probe by Electron Bombardment, Jpn. J. Appl. Phys., 2002, 4887-4889.

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