Optics: measuring and testing – Lamp beam direction or pattern
Reexamination Certificate
2006-08-15
2006-08-15
Toatley, Jr., Gregory J. (Department: 2877)
Optics: measuring and testing
Lamp beam direction or pattern
Reexamination Certificate
active
07092079
ABSTRACT:
An agile optical beam profiler using a two-dimensional small tilt digital micromirror device/chip, a translation stage, and single photodetector or pair of photodetectors. A method of profiling an optical beam includes positioning a programmable spatial light modulator in an incident optical beam and sequentially moving the spatial light modulator to at least one position in a first planar direction in a displacement increment less than a pixel width of the spatial light modulator. The method also includes directing respective portions of the optical beam to a photodetector at each position of the spatial light modulator. The method may also include calibrating the photodetectors by directing a portion of the beam to the photodetector, then directing the entire beam, or a remaining portion of the beam, to the photodetector, and normalizing the detected power of the portion with the detected power of the entire beam, or remaining portion, respectively.
REFERENCES:
patent: 3617755 (1971-11-01), Arnaud
patent: 5064284 (1991-11-01), Johnston, Jr. et al.
Agha Riza Nabeel
Mughal Muhammad Junaid
Beusse James H.
Beusse Wolter Sanks Mora & Maire, P.A.
Merlino Amanda
Nuonics, Inc.
Toatley , Jr. Gregory J.
LandOfFree
Digital optical beam profiler does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with Digital optical beam profiler, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Digital optical beam profiler will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-3614031