Optics: measuring and testing – Lamp beam direction or pattern
Reexamination Certificate
2005-07-26
2005-07-26
Toatley, Jr., Gregory J. (Department: 2877)
Optics: measuring and testing
Lamp beam direction or pattern
Reexamination Certificate
active
06922233
ABSTRACT:
An optical beam profiler using a spatial light modulator and photodetector. In an embodiment, the spatial light modulator is a two-dimensional (2-D) small tilt digital micromirror device. The profiler features fast speed, digital controls, low polarization sensitivity, and high measurement repeatability. The 2-D multi-pixel device-based profiler allows the use of several beam profile measurement concepts including moving knife edge, scanning slit, moving pinhole, variable aperture, and 2-D photodiode array. The proposed digital optical beam profiler can be implemented with any type of digitally operated 2-D spatial light modulator device such as using liquid crystals, magneto-optics, multiple quantum wells, electro-optic polymers, and photonic crystals.
REFERENCES:
patent: 3617755 (1971-11-01), Arnaud
patent: 5064284 (1991-11-01), Johnston, Jr. et al.
Beusse James H.
Buesse Brownlee Wolter Mora & Maire, P.A.
Merlino Amanda
Nuonics, Inc.
Toatley , Jr. Gregory J.
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