Digital measuring system and method for integrated circuit...

Data processing: generic control systems or specific application – Generic control system – apparatus or process – Plural processors

Reexamination Certificate

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C361S103000, C714S745000, C374S170000, C374S171000, C374S178000

Reexamination Certificate

active

07813815

ABSTRACT:
An integrated circuit contains within the chip one or more measuring devices that provide a digital value corresponding to respective physical operating parameters of the chip. The digital values can be communicated to other devices using an interrupt handler.

REFERENCES:
patent: 3808469 (1974-04-01), Raymond et al.
patent: 3821630 (1974-06-01), Kornrumpf et al.
patent: 4030363 (1977-06-01), Halleck
patent: 4549818 (1985-10-01), Nishikubo et al.
patent: 5349685 (1994-09-01), Houlberg
patent: 5560711 (1996-10-01), Bu
patent: 5684997 (1997-11-01), Kau et al.
patent: 5784377 (1998-07-01), Baydar et al.
patent: 5805403 (1998-09-01), Chemla
patent: 6028472 (2000-02-01), Nagumo
patent: 6125448 (2000-09-01), Schwan et al.
patent: 6275782 (2001-08-01), Mann
patent: 6283628 (2001-09-01), Goodwin
patent: 6311263 (2001-10-01), Barlow et al.
patent: 6319737 (2001-11-01), Putnam et al.
patent: 6370558 (2002-04-01), Guttag et al.
patent: 6630754 (2003-10-01), Pippin
patent: 6678625 (2004-01-01), Reise et al.
patent: 6695475 (2004-02-01), Yin
patent: 6735706 (2004-05-01), Tomlinson et al.
patent: 6779060 (2004-08-01), Azvine et al.
patent: 6783274 (2004-08-01), Umeyama et al.
patent: 6814485 (2004-11-01), Gauthier et al.
patent: 6848500 (2005-02-01), Langari et al.
patent: 6893154 (2005-05-01), Gold et al.
patent: 6937958 (2005-08-01), Gold et al.
patent: 6959258 (2005-10-01), Smith et al.
patent: 6996491 (2006-02-01), Gold et al.
patent: 7010438 (2006-03-01), Hancock et al.
patent: 7022113 (2006-04-01), Lockwood et al.
patent: 2003/0158683 (2003-08-01), Gauthier et al.
patent: 2003/0158696 (2003-08-01), Gold et al.
patent: 2004/0004994 (2004-01-01), Wu et al.
patent: 2004/0105488 (2004-06-01), Felder
patent: 2004/0135643 (2004-07-01), Clabes et al.
patent: 2004/0190585 (2004-09-01), Berndlmaier et al.
patent: 2005/0040810 (2005-02-01), Poirier et al.
patent: 2007/0248047 (2007-10-01), Shorty et al.

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