Digital measuring system and method for integrated circuit...

Thermal measuring and testing – Temperature measurement – By electrical or magnetic heat sensor

Reexamination Certificate

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Details

C374S163000, C327S513000, C702S130000

Reexamination Certificate

active

10339992

ABSTRACT:
This invention relates to digitally measuring operating parameters, for example, temperature, within a semiconductor chip and making those measurements internally available to hardware, firmware, and software.

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