Electricity: measuring and testing – Fault detecting in electric circuits and of electric components – Of individual circuit component or element
Reexamination Certificate
2005-11-17
2008-08-12
Nguyen, Vinh P (Department: 2829)
Electricity: measuring and testing
Fault detecting in electric circuits and of electric components
Of individual circuit component or element
C324S763010
Reexamination Certificate
active
07411409
ABSTRACT:
In one embodiment, an integrated circuit includes at least one digital leakage detector that includes digital circuitry configured to detect an approximation of a magnitude of the leakage current in transistors of the integrated circuit and configured to generate a digital output representing the approximated magnitude. In another embodiment, a leak detector includes leak circuits and clocked storage devices. Each leak circuit is configured to generate an output signal indicative of a different magnitude of leakage current in a transistor. The clocked storage devices are configured to capture a state representing the output signals of the leak circuits. In another embodiment, a method includes running a test for leakage current in a digital leakage detector, wherein a digital output of the digital leakage detector represents a magnitude of a leakage current being experienced by the integrated circuit during use; and outputting the digital output from the integrated circuit.
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Demas Andrew J.
Hess Greg M.
Jain Ashish R.
Klass Edgardo F.
Merkel Lawrence J.
Meyertons Hood Kivlin Kowert & Goetzel P.C.
Nguyen Vinh P
P.A. Semi, Inc.
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