Optics: measuring and testing – By polarized light examination – With light attenuation
Patent
1995-04-05
1995-12-19
Pham, Hoa Q.
Optics: measuring and testing
By polarized light examination
With light attenuation
356376, 348128, G01B 1130
Patent
active
054773326
ABSTRACT:
A computer controlled system for determining various physical surface characteristics of an object includes a light source array, positioned to illuminate a surface for evaluation, in which individual lights in the array illuminate the object on a mutually exclusive basis, a radiometer, positioned to receive light from the object, producing image data relative to positions of the light pixels and a computer apparatus that, among other functions in the system, interprets the image data and determines at least the surface waviness, radius of curvature and cant angle of the surface.
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Blackmon, Jr. James B.
Stone Kenneth W.
Goldman Ronald M.
McDonnell Douglas Corporation
Pham Hoa Q.
Turner Roger C.
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