Optics: measuring and testing – By particle light scattering – With photocell detection
Patent
1980-09-29
1982-08-31
Corbin, John K.
Optics: measuring and testing
By particle light scattering
With photocell detection
356351, G01B 902
Patent
active
043469990
ABSTRACT:
There is described a device for analyzing the wavefront of a light beam exiting the laser to detect any aberrations across the cross-sectional area of the beam from a planar wavefront. A rotating wave plate splits the beam from the laser into two orthogonally polarized beams separated in frequency by a frequency difference in the audio range. A polarization selective interferometer directs these two beams along a test arm and a reference arm. Quarterwave plates in each arm convert the outgoing waves to circular polarization and the return waves back to linear polarization but orthogonal to the input polarization. A linear polarizer at the output oriented at a 45.degree. angle to the polarizations causes the waves to interfere and a detector placed at any point in the output beam detects a beat signal at the audio frequency. The reference beam and the interferometer reference arm is made to produce a planar wavefront by passing the beam through a pinhole that is small enough to remove the aberrations existing on the incoming beam from the laser.
REFERENCES:
patent: 3857636 (1974-12-01), Angelbeck
patent: 4018531 (1977-04-01), Leendentz
patent: 4188122 (1980-02-01), Massie et al.
Corbin John K.
Field Harry B.
Hamann H. Fredrick
Koren Matthew W.
Rockwell International Corporation
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