Optics: measuring and testing – By light interference – Spectroscopy
Reexamination Certificate
2006-04-25
2006-04-25
Turner, Samuel A. (Department: 2877)
Optics: measuring and testing
By light interference
Spectroscopy
Reexamination Certificate
active
07034944
ABSTRACT:
The present invention relates to an FTIR spectrometer comprising a single-element detector to analyze a detector light beam emitted by a sample, with a unit to digitize the voltage available at the detector output and with a unit to process the digitized voltage. The single-element detector and the dedicated unit to digitize the detector voltage are located immediately adjacent to each other.
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Rapp Norbert
Simon Arno
Bruker Optik GmbH
Turner Samuel A.
Vincent Paul
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