Digital-fault loop probe and system

Details Digital-fault loop probe and system Digital-fault loop probe and system

1980-09-25

1982-09-07

Atkinson, Charles E.

Excavating

324 73AT, 371 25, G01R 3128

Patent

active

043487602

ABSTRACT:
The invention is a process and system for locating and identifying faulty components or faults in a circuit board (16) under test. The system includes a guided-logic probe box (20) that includes a hand held needle-tipped probe (30) and three circuit boards (32), (36) and (38), which detect and present information as to the type of signal being input to the probe needle (82). The information is presented to a human via a light (84) on the hand probe (30) and/or by three LED lights (41), (42) and (43) on the probe housing (22). The circuit board (36) includes two circuits (100) and (120). Circuit (120) is a logic separator circuit and includes latches (L.sub.1) and (L.sub.2), which gather and present information to the computer (78) of an automatic test system unit (10) via the pins (158) and (159). After acceptance by the computer (78), the computer can send back a signal via the pin (160) to reset latches (L.sub.1) and (L.sub.2) which are then free to probe another node. The testing process includes a series of steps, as set forth in the flow chart (130) which enables the system to determine what component or components are faulty in a signal loop.

REFERENCES:
patent: 3497685 (1970-02-01), Stafford et al.
patent: 3976864 (1976-08-01), Gordon et al.
patent: 4180203 (1979-12-01), Masters
patent: 4192451 (1980-03-01), Swerling et al.
patent: 4194113 (1980-03-01), Fulks et al.
patent: 4228537 (1980-10-01), Henckels et al.

Affiliated with

Also associated with

Rating

Digital-fault loop probe and system does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Digital-fault loop probe and system, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Digital-fault loop probe and system will most certainly appreciate the feedback.

Rate now

Comments { 0 }

Profile ID: LFUS-PAI-O-1345735