Digital device testing apparatus and method

Details Digital device testing apparatus and method Digital device testing apparatus and method

1982-04-19

1984-11-13

Ruggiero, Joseph F.

Excavating

340747, G06F 1100

Patent

active

044830025

ABSTRACT:
Testing apparatus monitors signals at selected test points in a tested device. An operator specifies sets of signals defining a display window during which all signals at the selected test points will be available to the operator for immediate or later examination. One set of signals defines the beginning of the window. Another set defines the end of the window, but only after other sets or conditions, also specified by the operator, occur. For each set, the operator specifies test points monitored, signal states expected and what happens when the expected states occur.

REFERENCES:
patent: 3771131 (1973-11-01), Ling
patent: 3813647 (1974-05-01), Loo
patent: 3818201 (1974-06-01), Hartwich et al.
patent: 3831149 (1974-08-01), Job
patent: 3927310 (1975-12-01), D'Anna et al.
patent: 3937938 (1976-02-01), Matthews
patent: 3976864 (1976-08-01), Gordon et al.
patent: 4009437 (1977-02-01), Lacher
patent: 4250562 (1981-02-01), Haag et al.
Publication Entitled "Rechnernetzwerke", by H. Kerner and G. Bruckner, (1981).
Computer Design article entitled "Logic Analyzers Simplify System Integration Tasks", Mar. 1981, pp. 119-126.

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