Optics: measuring and testing – Shape or surface configuration
Reexamination Certificate
2005-03-15
2005-03-15
Pham, Hoa Q. (Department: 2877)
Optics: measuring and testing
Shape or surface configuration
C250S559220
Reexamination Certificate
active
06867870
ABSTRACT:
A detector network for an optical metrology system includes an analog to digital converter for each photodetector or detector array. Each analog to digital converter is connected to provide digitally encoded output from its associated detector. Each analog to digital converter is also connected to a hub. The hub receives commands from a processor and distributes them to the analog to digital converters. The converters sample the output of their associated detectors and return the digitized results to the hub. In turn, the hub passes the digitized results to the processor for analysis.
REFERENCES:
patent: 5644141 (1997-07-01), Hooker et al.
patent: 6405591 (2002-06-01), Colarelli et al.
patent: 6546785 (2003-04-01), Discenzo
Lindseth Dale
Mihaylov Mihail
Pham Hoa Q.
Stallman & Pollock LLP
Therma-Wave, Inc.
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