Digital delay line tester

Details Digital delay line tester Digital delay line tester

1985-03-12

1986-08-05

Laroche, Eugene R.

Oscillators

Phase shift type

324 83FE, 324 85, G01R 2500

Patent

active

046045880

ABSTRACT:
The present invention describes a tester for determining the value of unknown delay lines in the nanosecond and subnanosecond range. The unknown delay line is introduced into the circuit loop of a free-running square wave oscillator previously calibrated to a predetermined frequency. A change in oscillator frequency occurs which is a measure of the value of the delay introduced into the loop by the unknown line. Such delay may be calculated as a function of the calibration and delay line-measured frequencies. The present tester provides measurements with increased accuracy and rapidity over previous measuring techniques.

REFERENCES:
patent: 2622127 (1952-12-01), Alsberg et al.

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