Digital conversion circuit and method for testing digital inform

Details Digital conversion circuit and method for testing digital inform Digital conversion circuit and method for testing digital inform

1982-10-25

1985-04-23

Smith, Jerry

Excavating

324 73R, 3401462, 371 25, G06F 1100

Patent

active

045134197

ABSTRACT:
A circuit and method are disclosed for testing line replaceable units (LRUs) and interconnect buses of an avionics system in which the various LRUs exchange information by means of transmitting and/or receiving digital communication words, each word having a predetermined, standardized serial bit format. A stream of communication words, each comprised of a predetermined number of bits, is serially received and converted to parallel format by a shift register that cooperates with a word counter also coupled to the stream of words, so as to output successively and in parallel format, each communication word. A general purpose digital data analyzer is used to display the binary form of each parallel bit word, and to decode and display the engineering and numeric data contained therein. The order of a certain field of bits of each word representing a word label is reversed in the shift register to enable direct decoding of the label by the data analyzer. Predetermined words can be selected from the stream for display and further analysis by means of a label detector cooperating with a label comparator and select switches which monitor certain parallel outputs of the shift register.

REFERENCES:
patent: 3025349 (1962-03-01), Peterson
patent: 3274379 (1966-09-01), Hinrichs
patent: 3277447 (1966-10-01), Newman et al.
patent: 3582882 (1971-06-01), Tikomb
patent: 3651481 (1972-03-01), Evans et al.
patent: 3662373 (1972-05-01), Schumann
patent: 3752917 (1973-08-01), Foley et al.
patent: 3772680 (1973-11-01), Kawai et al.
patent: 3787819 (1974-01-01), Busink
patent: 3796834 (1974-03-01), Kuhar, Jr.
patent: 3858196 (1974-12-01), Vrabel et al.
patent: 3887869 (1975-06-01), Connolly et al.
patent: 3891982 (1975-06-01), Cheek et al.
patent: 3920919 (1975-11-01), Aillet
patent: 3971011 (1976-07-01), Borchert
patent: 4044345 (1977-08-01), Ueda et al.
patent: 4101903 (1978-07-01), Slay
patent: 4166271 (1979-08-01), Thirlwall et al.
patent: 4227175 (1980-10-01), Newman
patent: 4257068 (1981-03-01), Johnston
patent: 4375635 (1983-03-01), Leow et al.
patent: 4393498 (1983-07-01), Jackson et al.
patent: 4434488 (1984-02-01), Palmquist et al.
patent: 4441074 (1984-04-01), Bockett-Pugh et al.

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