Digital circuits with adaptive resistance to single event upset

Details Digital circuits with adaptive resistance to single event upset Digital circuits with adaptive resistance to single event upset

2010-09-09

2011-10-18

Donovan, Lincoln (Department: 2816)

Miscellaneous active electrical nonlinear devices, circuits, and

Specific signal discriminating without subsequent control

By pulse width or spacing

C327S170000, C327S185000, C327S379000

Reexamination Certificate

active

08040157

ABSTRACT:
A digital circuit with adaptive resistance to single event upset. A novel transient filter is placed within the feedback loop of each latch in the digital circuit to reject pulses having a width less than T, where T is the longest anticipated duration of transients. The transient filter includes a first logic element having a controllable inertial delay and a second logic element coupled to an output of the first logic element. A first controller provides a control voltage VcR to each first logic element to control a rise time of the first logic element to be equal to T. A second controller provides a control voltage VcF to each first logic element to control a fall time of the first logic element to be equal to T.

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