Digital circuit multi-test system with automatic setting of test

Details Digital circuit multi-test system with automatic setting of test Digital circuit multi-test system with automatic setting of test

1984-09-18

1985-04-09

Miller, Stanley D.

Electricity: measuring and testing

Plural, automatically sequential tests

307264, G01R 3128, H03K 1908

Patent

active

045104395

ABSTRACT:
A pair of complementary VMOS transistors connected in push-pull is utilized to convert pulses supplied to the gates of these transistors into two-level output signals of which each of the voltage levels is independently adjustable. A digital-to-analog converter is connected to each of the VMOS transistor channels inputs, so that the two voltage levels in question can be set and changed by digital input to the converters provided by a microprocessor. Controlling the d.c. levels of output pulses by a microprocessor makes possible the testing of electronic circuits utilizing different kinds of electronic logic with a single test unit. The selection of the voltage levels of the output pulses to match the type of logic of the circuits to which the pulses are applied can be made through the microprocessor in response to a signal representative of the supply voltage of the circuits under test.

REFERENCES:
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patent: 4379264 (1983-04-01), Lenhardt
Holt, "Electronic Circuits: Digital and Analog", 1978, John Wiley & Sons, New York, pp. 784-786.

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