Data processing: measuring – calibrating – or testing – Measurement system in a specific environment – Electrical signal parameter measurement system
Reexamination Certificate
2006-03-07
2006-03-07
Hoff, Marc S. (Department: 2857)
Data processing: measuring, calibrating, or testing
Measurement system in a specific environment
Electrical signal parameter measurement system
C702S065000, C702S066000, C702S067000
Reexamination Certificate
active
07010439
ABSTRACT:
The invention relates to a digital circuit making it possible to measure the effective voltage of a signal, comprising at least one module exhibiting a sampler stage exhibiting an output generating an output logic signal which, for each given sampling period, exhibits a level representing the value of the voltage of the signal with respect to a given threshold (A), characterized in that it comprises a circuit (CIRC) for calculating a value representative of said effective voltage as a function of the difference between the number of times the output logic signal indicates that the voltage of the signal is above the given threshold (A) and the number of times the output logic signal indicates that this value is below said given threshold (A) over a duration corresponding to N given sampling periods.
REFERENCES:
patent: 5245343 (1993-09-01), Greenwood et al.
patent: 6255866 (2001-07-01), Wolaver et al.
patent: 6664908 (2003-12-01), Sundquist et al.
patent: 63 103976 (1988-05-01), None
Camps Carmona Adriano José
Martin Neira Manuel
Piironen Petri Viljo Emil
Sempere Payá Luis
Agence Spatiale Europeenne
Hoff Marc S.
Suarez Felix
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