Coded data generation or conversion – Converter compensation
Reexamination Certificate
2006-12-13
2009-11-24
Mai, Lam T (Department: 2819)
Coded data generation or conversion
Converter compensation
C341S155000
Reexamination Certificate
active
07623050
ABSTRACT:
A method and apparatus to counter effects of an offset voltage by calibrating an analog-to-digital converter (ADC). A digital calibration loop minimizes the effects of offset voltage to improve ADC accuracy as well as provide a low-power, submicron-scale ADC. A calibration circuit senses an ADC output and adjusts a variable calibration voltage to counter the effects of the offset voltage. Reduction of the offset voltage effects increases the ADC accuracy.
REFERENCES:
patent: 3651517 (1972-03-01), Kurek et al.
patent: 5732276 (1998-03-01), Komatsu et al.
patent: 5783977 (1998-07-01), Chethik
patent: 5818370 (1998-10-01), Sooch et al.
patent: 5914638 (1999-06-01), He
patent: 6348886 (2002-02-01), Frank et al.
patent: 6392581 (2002-05-01), Yang
patent: 6525615 (2003-02-01), Masenas et al.
patent: 6603416 (2003-08-01), Masenas et al.
patent: 6812777 (2004-11-01), Tamura et al.
patent: 6963237 (2005-11-01), Tamura et al.
patent: 7003023 (2006-02-01), Krone et al.
patent: 7046179 (2006-05-01), Taft et al.
patent: 7102555 (2006-09-01), Collins et al.
patent: 7209172 (2007-04-01), Jelley et al.
patent: 7307572 (2007-12-01), Garrity et al.
patent: 7456764 (2008-11-01), Chen
patent: 7466249 (2008-12-01), Chen
patent: 2003/0081706 (2003-05-01), Ciccarelli et al.
patent: 2004/0076360 (2004-04-01), Chen et al.
patent: 2005/0123036 (2005-06-01), Rahman et al.
patent: 2006/0160511 (2006-07-01), Trichy et al.
patent: 2007/0132617 (2007-06-01), Le
patent: 2007/0132625 (2007-06-01), Chen
patent: 2007/0132627 (2007-06-01), Chen
patent: 2007/0132628 (2007-06-01), Chen
patent: 2007/0146191 (2007-06-01), Iwata et al.
patent: 2008/0129567 (2008-06-01), Lee et al.
patent: 2009/0058698 (2009-03-01), Chen
patent: 2009/0058699 (2009-03-01), Chen
patent: 2009/0058700 (2009-03-01), Chen
Chen Chun-Ying
Kim Kwang Young
Le Michael
Pan Hui
Tong Wynstan
Broadcom Corporation
Mai Lam T
Sterne Kessler Goldstein & Fox P.L.L.C.
LandOfFree
Digital calibration loop for an analog to digital converter does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with Digital calibration loop for an analog to digital converter, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Digital calibration loop for an analog to digital converter will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-4059404