Digital calibration for analog-to-digital converters with implic

Coded data generation or conversion – Converter calibration or testing

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341161, H03M 106

Patent

active

059778946

ABSTRACT:
A method of digital calibration for analog-to-digital converters providing implicit gain proration. In accordance with the method, the calibration begins at the center of the transfer curve rather from one end or the other. By beginning in the center, calibrating in the positive direction and then calibrating in the negative direction, the interstage gain errors are also corrected without an extra gain-proration cycle. In addition, the number of accumulated measurements is reduced by a factor of two for the final correction coefficient by using the preferred method. Therefore, the roundoff errors are also reduced.

REFERENCES:
patent: 5635937 (1997-06-01), Lim et al.
patent: 5870041 (1999-02-01), Lee et al.
"A 10-b 15-MHz CMOS Recycling Two-Step A/D Converter", Bang-Sup Song et al., IEEE Journal of Solid-State Circuits, vol. 25, No. 6 (Dec. 1990).
"Digital-Domain Calibration of Multistep Analog-to-Digital Converters", Seung-Hoon Lee et al., IEEE Journal of Solid-State Circuits, vol. 27, No. 12 (Dec. 1992).
"Interstage Gain Proration Technique for Digital-Domain Multi-Step ADC Calibration", Seung-Hoon Lee et al., IEEE Transactions on Circuits and Systems, vol. 41, No. 1 (Jan. 1994).
Eric G. Soenen et al., "An Architecture and An Algorithm for Fully Digital Correction of Monolithic Pipelined ADC's", IEEE Trans. on Circuits and Systems, Mar. 1995, vol. 42, No. 3.

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