Data processing: measuring – calibrating – or testing – Measurement system in a specific environment – Electrical signal parameter measurement system
Reexamination Certificate
2007-06-26
2007-06-26
Barlow, John (Department: 2863)
Data processing: measuring, calibrating, or testing
Measurement system in a specific environment
Electrical signal parameter measurement system
C375S297000
Reexamination Certificate
active
10845941
ABSTRACT:
The present invention relates to a device and method that digitally replicates the analog processing that is normally associated with an instantaneous frequency measurement device. Specifically, the present relates to a digital frequency measurement device comprising: a filter, where the filter receives an input RF signal and transmits an output signal centered around a desired frequency; a limiting amplifier downstream of the filter, where the amplifier receives and amplifies the output signal; a deserializer downstream of the amplifier that continuously samples the output signal from the limiting amplifier; and a digital frequency measurement processor (DFM), where the DFM receives data at a rate of 1/16 of the deserializer sample rate. The DFM transforms the data into multiples stages that are combined in order to produce an estimate of the input signal, where the DFM is implemented through a digital processing device.
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BAE Systems Information and Electronic Systems Integration Inc.
Barlow John
Haley Barry L.
Le Toan M.
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