Optics: measuring and testing – By particle light scattering – With photocell detection
Patent
1988-07-25
1990-12-11
Willis, Davis L.
Optics: measuring and testing
By particle light scattering
With photocell detection
G01B 902, G01J 345
Patent
active
049765426
ABSTRACT:
An interferometer with a cylindrical lens which produces an interferogram imaging the field of view in the redundant coordinate onto a photon noise limited detector comprising a charge-coupled device or CCD having pixels aligned along two dimensions to provide spatial resolution in that dimension of the light source as well as spectral resolution. The CCD is also characterized by greater dynamic range, lower pixel response variation, and is photon noise limited, all of which enhances its use as a detector for a spectrometer.
REFERENCES:
patent: 4523846 (1985-06-01), Breckinridge et al.
patent: 4750834 (1988-06-01), Fateley
Koren Matthew W.
Washington University
Willis Davis L.
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