Diffractometer

Details Diffractometer Diffractometer

2006-10-03

2006-10-03

Glick, Edward J. (Department: 2882)

X-ray or gamma ray systems or devices

Specific application

Diffraction, reflection, or scattering analysis

C378S073000

Reexamination Certificate

active

07116754

ABSTRACT:
A monochromator4is used to direct X-rays from X-ray source2onto a sample14as a convergent beam. The sample14is in a growth chamber. The sample is rotated, and diffraction measurements are made in parallel with multichannel detector22. A specific reflection is used so that the intensity against angle graph measured in the multichannel detector gives information about the vertical lattice parameter. To compensate for wobble inevitably introduced by the rotation of the sample, short time measurements are made and summed.

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