Diffractographic and other sensors utilizing diffraction waves

Optics: measuring and testing – Material strain analysis

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Details

356111, 73 88A, G01B 1116, G01B 902, G01B 530

Patent

active

039945847

ABSTRACT:
A method and devices for sensing changes in separation of a first member relative to a second member, as well as variables causing such changes is disclosed. Electromagnetic waves diffracted by means included in said first member interact with waves from means included in said second member to form a characteristic interference pattern. Measured changes in this pattern allow determination of changes in separation.

REFERENCES:
patent: 3308303 (1967-03-01), Weichselbaum et al.
patent: 3518007 (1970-06-01), Ito
patent: 3592545 (1971-07-01), Paine
patent: 3658429 (1972-04-01), Zipin
patent: 3709610 (1973-01-01), Kruegle

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