Diffraction encoded position measuring apparatus

Details Diffraction encoded position measuring apparatus Diffraction encoded position measuring apparatus

1989-06-14

1991-09-24

Turner, Samuel

Optics: measuring and testing

By dispersed light spectroscopy

Utilizing a spectrometer

356349, 250237G, G01B 902

Patent

active

050509934

ABSTRACT:
When a lightwave passes through a transmission grating, diffracted beams appear at the output or opposite side of the grating that are effectively Doppler shifted in frequency (phase) whereby a detector system can compare the phase of the zero order and higher order beams to obtain an indication of position. Multiple passes through the grating increase resolution for a given wavelength of a laser signal. The resolution can be improved further by using a smaller wavelength laser to generate the grating itself. Since the grating must only have a pitch sufficient to produce diffracted orders, inexpensive, ultraviolet wavelength lasers can be utilized and still obtain high resolution detection.

REFERENCES:
patent: 3738753 (1973-06-01), Huntley
patent: 4170026 (1987-12-01), Magome et al.
patent: 4676645 (1987-06-01), Taniguchi et al.

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