Electricity: measuring and testing – Testing potential in specific environment – Voltage probe
Reexamination Certificate
2005-02-15
2005-02-15
Le, N. (Department: 2858)
Electricity: measuring and testing
Testing potential in specific environment
Voltage probe
C324S149000, C324S690000, C324S715000, C324S724000
Reexamination Certificate
active
06856126
ABSTRACT:
A voltage probe includes a first signal lead configured to receive a first signal from a device under test, a first probe-tip network that is coupled to the first signal lead and that has a frequency response that includes a first transmission zero, a first compensation network that is coupled to the first probe-tip network and that has a frequency response that includes a first transmission pole, a second signal lead configured to receive a second signal from the device under test, a second probe-tip network that is coupled to the second signal lead and that has a frequency response that includes a second transmission zero, a second compensation network that is coupled to the second probe-tip network and that has a frequency response that includes a second transmission pole, and a differential amplifier circuit that is coupled to the first compensation network and to the second compensation network, and that is configured to provide a third signal that is responsive to the first signal and to the second signal. Methods and other systems for providing electrical connections to devices under test are disclosed.
REFERENCES:
patent: 4743839 (1988-05-01), Rush
patent: 5796308 (1998-08-01), Link et al.
patent: 6373348 (2002-04-01), Hagerup
Kimura Bob
Lujan Michael J.
McTigue Michael T.
Rush Kenneth
Agilent Technologie,s Inc.
Le N.
Teresinski John
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