Thermal measuring and testing – Differential thermal analysis
Patent
1999-01-15
2000-11-14
Gutierrez, Diego
Thermal measuring and testing
Differential thermal analysis
374 11, G01N 2500
Patent
active
061460125
ABSTRACT:
The DSC (DTA) signal waveform measured under an experimental heating rate condition is separated into a base line and individual basic peak elements, and the respective activation energies are calculated corresponding to each of basic peak elements separated. A DSC (DTA) signal that should be obtained at an another heating rate is estimated from the data obtained from the experimental heating rate and it is outputted. In this process, the temperature shift caused by heating rate difference is corrected using the values of activation energies obtained.
REFERENCES:
patent: 3747396 (1973-07-01), O'Neill
patent: 4552465 (1985-11-01), Anderson
patent: 4812051 (1989-03-01), Paulik et al.
patent: 5152607 (1992-10-01), Ibar
patent: 5439291 (1995-08-01), Reading
patent: 5549387 (1996-08-01), Shawe et al.
Kinoshita Ryoichi
Nakamura Nobutaka
Nakatani Rintaro
DeJesus Lydia M.
Gutierrez Diego
Seiko Instruments Inc.
LandOfFree
Differential thermal analyzer does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with Differential thermal analyzer, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Differential thermal analyzer will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-2058586