Thermal measuring and testing – Thermal testing of a nonthermal quantity
Patent
1992-05-15
1993-04-13
Cuchlinski, Jr., William A.
Thermal measuring and testing
Thermal testing of a nonthermal quantity
374120, 25037003, 250332, 358113, 73808, G01N 2500, G01N 332
Patent
active
052015823
ABSTRACT:
The instrument has a focal plane array of infrared sensors of the integrating type such as a multiplexed device in which a charge is built up on a capacitor which is proportional to the total number of photons which that sensor is exposed to between read-out cycles.
The infrared sensors of the array are manufactured as part of an overall array which is part of a micro-electronic device. The sensor achieves greater sensitivity by applying a local offset to the output of each sensor before it is converted into a digital word. The offset which is applied to each sensor will typically be the sensor's average value so that the digital signal which is periodically read from each sensor of the array corresponds to the portion of the signal which is varying in time. With proper synchronization between the cyclical loading of the test object and the frame rate of the infrared array the output of the A/D converted signal will correspond to the stress field induced temperature variations. A digital lock-in operation may be performed on the output of each sensor in the array. This results in a test instrument which can rapidly form a precise image of the thermoelastic stresses in an object.
REFERENCES:
patent: 3934452 (1976-01-01), Prevorsek et al.
patent: 4126033 (1978-11-01), Bartoli et al.
patent: 4378701 (1983-04-01), Mountain et al.
patent: 4541059 (1985-09-01), Toshihiko
patent: 4607963 (1986-08-01), Ulrickson
patent: 4625545 (1986-12-01), Holm et al.
patent: 4798477 (1989-01-01), Mountain
patent: 4828400 (1989-05-01), Boyce
patent: 4868389 (1989-09-01), Moore
patent: 4878116 (1989-10-01), Thomas et al.
patent: 4955236 (1990-09-01), Yokoyama et al.
patent: 4969037 (1990-11-01), Poleschinski et al.
"128.times.128 InSb InfraRed Imaging System," Amber Engineering, Inc., Santa Barbara, Calif.
"Spate 9000 Dynamic Stress Analyzer," Ometron Limited, London, England.
Bennett G. Bradley
Cuchlinski Jr. William A.
Stress Photonics Inc.
LandOfFree
Differential temperature stress measurement employing array sens does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with Differential temperature stress measurement employing array sens, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Differential temperature stress measurement employing array sens will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-1150384