Data processing: measuring – calibrating – or testing – Measurement system in a specific environment – Chemical analysis
Patent
1997-11-04
2000-07-04
Hoff, Marc S.
Data processing: measuring, calibrating, or testing
Measurement system in a specific environment
Chemical analysis
702 27, 702 30, 356326, 356327, G06F 1900
Patent
active
060851538
ABSTRACT:
The present invention provides a new analysis based on Differential Spectral Topographic Analysis (DISTA). Using data from the spectral methods known in the art, DISTA is based upon the normalization of the spectra to a fixed topographic space, creating a set of spectral forms, and the summation of the absolute differences in topography between one or more reference spectra and the test spectra taken at different magnitudes of the perturbing parameter. This method allows for a sensitive estimate of the fraction of form A and form B of an entity of interest. This method also allows for the calculation of apparent free energy from the conversion of the entity of interest from a first to a second form where appropriate, and in the alternative, calculation of a fraction of structural changes.
REFERENCES:
patent: 4267572 (1981-05-01), Witte
patent: 4642778 (1987-02-01), Hieftje et al.
patent: 4885697 (1989-12-01), Hubner
patent: 5446681 (1995-08-01), Gethner et al.
patent: 5481476 (1996-01-01), Windig
patent: 5612783 (1997-03-01), Hirsh
Hirsh Allen G
Litvinovitch Serguei
Mehl Patrick M.
Tsonev Latchezar I.
Bui Bryan
Henry M. Jackson Foundation
Hoff Marc S.
LandOfFree
Differential spectral topographic analysis (DISTA) does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with Differential spectral topographic analysis (DISTA), we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Differential spectral topographic analysis (DISTA) will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-1495047