Differential refractometer and its adjusting method

Optics: measuring and testing – Refraction testing – Differential

Reexamination Certificate

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Reexamination Certificate

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07495754

ABSTRACT:
Adjustment of a differential refractometer includes the steps of (a) equally focusing a slit image on separate portions of a photodetector, (b) decreasing the quantity of light of measuring beam, (c) making parallel movement of the slit image on the photodetector by a predetermined displacement, and (d) increasing the quantity of light of the measuring beam.

REFERENCES:
patent: 5398110 (1995-03-01), Kitaoka
patent: 60250230 (1985-12-01), None
patent: 61-226640 (1986-10-01), None

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