Chemistry: analytical and immunological testing – Optical result – Spectrum analysis
Reexamination Certificate
2006-04-11
2008-05-06
Soderquist, Arlen (Department: 1797)
Chemistry: analytical and immunological testing
Optical result
Spectrum analysis
C250S372000, C356S051000, C356S217000, C356S303000, C356S319000, C356S326000, C356S447000, C422S082050, C422S082090, C436S107000, C436S110000
Reexamination Certificate
active
07368292
ABSTRACT:
A system and method for identifying explosive or other target materials includes the steps of irradiating a first location and a second location spaced apart from the first location from a sample suspected of including explosives with ultraviolet, visible or infrared light, measuring reflected light emanated from the first sample location (R1) and reflected light emanated from the second sample location (R2), and calculating a normalized difference in reflectivity (ΔR/R), whereinR=(R1+R2)/2 is an average reflectivity. A differential reflection spectrum (DRS) is then generated for the sample where ΔR=R2−R1is the difference of the reflectivities of the first and the second sample location. One or more explosives if present are identified in the sample based on comparing the DRS for said sample to at least one reference DRS.
REFERENCES:
patent: 5357346 (1994-10-01), Piekarski et al.
patent: 6061141 (2000-05-01), Goldenberg et al.
patent: 6343534 (2002-02-01), Khanna et al.
patent: 2004/0124376 (2004-07-01), Ershov et al.
patent: 2005/0024199 (2005-02-01), Huey et al.
patent: 2005/0207943 (2005-09-01), Puzey
patent: 2006/0022140 (2006-02-01), Connelly et al.
patent: 2297377 (1996-07-01), None
patent: 2417554 (2006-03-01), None
patent: WO 2004/083796 (2004-09-01), None
Pristera, F. et al, Analytical Chemistry 1960, 32, 495-508.
Chance, B. et al, Review of Scientific Instruments 1963, 34, 1307-1311.
Sell, D. D., Applied Optics 1970, 9, 1926-1930.
McIntyre, J. D. E. et al, Surface Science 1971, 24, 417-434.
Batz, B., Journal of Physics E: Scientific Instruments 1976, 9, 76-78.
Wolterbeek, L. et al, Surface Science 1985, 152-153, 1071-1078.
Selci, S. et al, Journal of Vacuum Science & Technology A 1987, 5, 327-332.
Gal, M. et al, SPIE 1990, 1286, 136-145.
Hummel, R. E., SPIE 1990, 1286, 146-153.
Burns, T. M. et al, Journal of Vacuum Science & Technology B 1993, 11, 78-85.
Kim, S. et al, Journal of Physical Chemistry B 1997, 101, 2735-2740.
Kaur, M. et al, Current Topics in Forensic Science, Proceedings of the Meeting of the International Association of Forensic Sciences, 14th, Tokyo, Aug. 26-30, 1996 (1997), vol. 4, 228-234, Editors: Takatori, T. et al, Publisher: Shunderson Communications, Ottawa, Ont.
Arbuthnot, D. et al, SPIE 1998, 3392, 432-440.
MacCrehan, W. A. et al, SPIE 1999, 3576, 116-124.
Zha, F. X. et al, Review of Scientific Instruments 1999, 70, 1798-1800.
Moore, D. S., Review of Scientific Instruments 2004, 75, 2499-2512.
Proehl, H. et al, Physical Review B 2005, 71, 165207/1-165207/14.
Fitch, M. J. et al, SPIE 2005, 5790, 281-288.
Skorpikova, M., New Trends in Research of Energetic Materials, Proceedings of the Seminar, 8th, Pardubice, Czech Republic, Apr. 19-21, 2005, vol. 2, 810-815, Editor: Vagenknecht, J., Publisher: University of Pardubice, Pardubice, Czech Rep.
Hummel, R. E. et al, Applied Physics Letters 2006, 88, 231903/1-231903/3.
Aspnes, D. E., IEEE Journal of Quantum Electronics 1989, 25, 1056-1063.
Nee, T. W. et al, Journal of Applied Physics 1990, 68, 5314-5317.
Rodriguez, R. et al, Journal of Colloid and Interface Science 1996, 177, 122-131.
Henderson, G. Journal of Chemical Education 1999, 76, 868-870.
Gal, M. SPIE 2001, 4594, 128-138.
Yu, G. et al, Applied Physics Letters 2003, 83, 3683-3685.
Tucks, A. et al, Journal of Solid State Chemistry 2005, 178, 1145-1156.
Borensztein, Y. Physica Status Solidi A 2005, 202, 1313-1324.
Hummel, R.E. “Differential Reflectometry and Its Application to the Study of Alloys, Ordering, Corrosion, and Surface Properties”, Phys. Stat. Sol. (a), vol. 76, No. 11, 1983, pp. 12-44.
Hummel, R.E. “Differential Reflectance Spectroscopy in Analysis of Surfaces”, Encyclopedia of Analytical Chemistry Ed. R.A. Meyers Chichester: John Wiley & Sons Ltd., 2000, pp. 9047-9071.
Felt et al. “UV-VIS spectroscopy of 2,4,6-trinitrotoluene-hydroxide reaction”, Chemosphere, vol. 49, 2002, pp. 287-295.
Abe, T. “Ultraviolet Absorption Spectra of Nitro-, Dinitro- and Trinitro-substituted Benzenes”, Bulletin Chem. Soc., 1958, vol. 31, No. 8, pp. 904-907.
Holbrook et al. “A ‘Differential Relectometer’ for Measurements of Small Differences in Reflectivity”, The Review of Scientific Instruments, 1973, vol. 44, No. 4, pp. 463-466.
Hummel et al. “Optical Reflectivity Measurement on Alloys by Compositional Modulation”, Physical Review Letters, 1970, vol. 25, No. 3, pp. 290-292.
Fuller Ann Marie
Holloway Paul H.
Hummel Rolf E.
Schollhorn Claus
Akerman & Senterfitt
Lefkowitz Gregory M.
Nelson Gregory A.
Soderquist Arlen
University of Florida Research Foundation Inc.
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