Optics: measuring and testing – By light interference – Using fiber or waveguide interferometer
Reexamination Certificate
2006-10-02
2009-11-24
Connolly, Patrick J (Department: 2877)
Optics: measuring and testing
By light interference
Using fiber or waveguide interferometer
C356S480000, C385S012000
Reexamination Certificate
active
07623245
ABSTRACT:
A differential pressure measuring system includes a light source for emitting a light, a first transducer for attenuating the intensity of the emitted light in a first range, depending on a first pressure, and providing a first light, a second transducer for attenuating the intensity of the first light in a second range, depending on a second pressure, and providing a second light, a feedback circuit for adjusting the intensity of the emitted light to maintain the intensity of the second light in the second range constant, and a measuring module for measuring a differential pressure between the first and second pressures, based on the intensities of the second light in the first and second ranges.
REFERENCES:
patent: 4730622 (1988-03-01), Cohen
patent: 4899046 (1990-02-01), Wright et al.
patent: 4933545 (1990-06-01), Saaski et al.
patent: 5798834 (1998-08-01), Brooker
patent: 6829397 (2004-12-01), Wang et al.
patent: 2003/0234921 (2003-12-01), Yamate et al.
patent: 2005/0232531 (2005-10-01), Hadley et al.
patent: 2003-166890 (2003-06-01), None
Connolly Patrick J
Meyer Jerald L.
The Nath Law Group
Yamatake Corporation
Zhang Jiaxiao
LandOfFree
Differential pressure measuring system and differential... does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with Differential pressure measuring system and differential..., we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Differential pressure measuring system and differential... will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-4079060