Differential planarization

Active solid-state devices (e.g. – transistors – solid-state diode – Combined with electrical contact or lead – Of specified material other than unalloyed aluminum

Reexamination Certificate

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Details

C257S686000, C257S690000, C257S620000, C257S621000, C257S758000, C257SE21583, C257SE21580

Reexamination Certificate

active

07105925

ABSTRACT:
Method and structure for optimizing and controlling chemical mechanical planarization are disclosed. Embodiments of the invention include planarization techniques to make nonplanar surfaces comprising alternating metal and intermetal layers. Relative protrusion dimensions and uniformity of various layers may be accurately controlled using the disclosed techniques.

REFERENCES:
patent: 5721172 (1998-02-01), Jang et al.
patent: 6194313 (2001-02-01), Singh et al.
patent: 6232231 (2001-05-01), Sethuraman et al.
patent: 6281114 (2001-08-01), Lin et al.
patent: 6355147 (2002-03-01), Griffiths et al.
patent: 6375694 (2002-04-01), Roberts et al.
patent: 6391768 (2002-05-01), Lee et al.
patent: 6492274 (2002-12-01), Pryor
patent: 6815354 (2004-11-01), Uzoh et al.
patent: 6870270 (2005-03-01), Kobrinsky et al.
patent: 2001/0055870 (2001-12-01), Tsutsui
patent: 2003/0211815 (2003-11-01), Carter et al.
patent: 2003/0219982 (2003-11-01), Kurata et al.
International Search Report PCT/US 03/39192.

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