Optics: measuring and testing – By light interference – Having light beams of different frequencies
Reexamination Certificate
2011-07-05
2011-07-05
Chowdhury, Tarifur (Department: 2886)
Optics: measuring and testing
By light interference
Having light beams of different frequencies
C356S479000, C356S497000
Reexamination Certificate
active
07973939
ABSTRACT:
A differential-phase polarization-sensitive optical coherence tomography system includes a polarized heterodyne interferometer for generating a reference beam to be reflected by a movable mirror unit, and a signal beam to be reflected by an imaging plane in a specimen. The interferometer further generates a first electrical signal output corresponding to first linear polarized waves of the reference and signal beams, and a second electrical signal output corresponding to second linear polarized waves of the reference and signal beams. A differential amplifier receives the first and second electrical signal outputs, and generates a differential signal output therefrom. A data acquisition unit is used to measure amplitudes of the first and second electrical signal outputs and the differential signal output. A computing unit computes the amplitudes measured by the data acquisition unit to determine a reflectivity, a phase retardation, and a fast axis angle of the imaging plane in the specimen.
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Chou Chien
Chowdhury Tarifur
Cook Jonathon D
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