Electricity: measuring and testing – Impedance – admittance or other quantities representative of... – Lumped type parameters
Reexamination Certificate
2007-04-12
2009-10-27
Nguyen, Vincent Q (Department: 2831)
Electricity: measuring and testing
Impedance, admittance or other quantities representative of...
Lumped type parameters
C324S691000, C324S713000
Reexamination Certificate
active
07609075
ABSTRACT:
For measuring a voltage difference between two measurement potentials at the input of a voltage converter that can be controlled via a control input, the measurement potentials are shifted by a voltage potential defined by a first pair of impression currents to obtain a first pair of shifted measurement potentials at the output of the voltage converter. Subsequently, the measurement potentials are shifted by a voltage potential defined by a second pair of impression currents different to the first pair to obtain a second pair of shifted measurement potentials. A controller determines measurement phases, in which the first or second pair of measurement potentials, respectively, is determined. An evaluator determines the voltage difference based on the first voltage difference between the first pair of shifted measurement potentials and based on the second voltage difference between the second pair of shifted measurement potentials and outputs the same at the output.
REFERENCES:
patent: 5506509 (1996-04-01), Susak
patent: 7049832 (2006-05-01), Novak et al.
patent: 7449896 (2008-11-01), Ochi
patent: 2006/0033509 (2006-02-01), Awaji et al.
Eschweiler & Associates LLC
Infineon - Technologies AG
Nguyen Vincent Q
Zhu John
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