Differential, level-shifted EEPROM structures

Static information storage and retrieval – Floating gate – Particular connection

Reexamination Certificate

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C365S185210, C365S185180, C365S185270, C365S189110

Reexamination Certificate

active

07916539

ABSTRACT:
Memory embodiments are provided to operate in memory systems which are configured to have a system ground and a system substrate that are biased at different voltages. At least one of these embodiments includes a memory cell and write and read circuits in which the memory cell is coupled to the system substrate and the write and read circuits are coupled to the system ground. The memory cell preferably has a cross-coupled pair of transistors which can be set in first and second states. The write circuit is arranged and level shifted to drive the cross-coupled pair into either selected one of the states and the read circuit is arranged and level shifted to provide a data signal indicative of the selected state.

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