Differential interferometers creating desired beam patterns

Optics: measuring and testing – By light interference – Having polarization

Reexamination Certificate

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C356S493000

Reexamination Certificate

active

10900529

ABSTRACT:
An interferometer system includes a rhomboid assembly having a first optical stack and a second optical stack mounted on the first stack. The first stack includes a first prism having an angled face mounted to an angled face of a second prism. The interface between these angled faces includes a first polarizing beam-splitter. The second stack includes a third prism having an angled face mounted to an angled face of the fourth prism. The interface between these angled faces includes a second polarizing beam-splitter. First, second, third, and fourth wave plate elements are located in beam paths between the rhomboid assembly and at least one of a measurement optic and a reference optic. A redirecting optic is located at least adjacent to the vertical faces of the first and the third prisms.

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patent: 6542247 (2003-04-01), Bockman
patent: 6836335 (2004-12-01), Hill et al.
patent: 2004/0156134 (2004-08-01), Furuki et al.

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