Differential interference phase contrast X-ray imaging system

Details Differential interference phase contrast X-ray imaging system Differential interference phase contrast X-ray imaging system

2009-04-21

2011-12-06

Ho, Allen C. (Department: 2882)

X-ray or gamma ray systems or devices

Specific application

Holography or interferometry

C378S062000

Reexamination Certificate

active

08073099

ABSTRACT:
A differential phase-contrast X-ray imaging system is provided. Along the direction of X-ray propagation, the basic components are X-ray tube, filter, object platform, X-ray phase grating, and X-ray detector. The system provides: 1) X-ray beam from parallel-arranged source array with good coherence, high energy, and wider angles of divergence with 30-50 degree. 2) The novel X-ray detector adopted in present invention plays dual roles of conventional analyzer grating and conventional detector. The basic structure of the detector includes a set of parallel-arranged linear array X-ray scintillator screens, optical coupling system, an area array detector or parallel-arranged linear array X-ray photoconductive detector. In this case, relative parameters for scintillator screens or photoconductive detector correspond to phase grating and parallel-arranged line source array, which can provide the coherent X-rays with high energy.

REFERENCES:
patent: 5354982 (1994-10-01), Nelson et al.
patent: 5812629 (1998-09-01), Clauser
patent: 6078643 (2000-06-01), Vogelsong et al.
patent: 6326625 (2001-12-01), Zur
patent: 6552356 (2003-04-01), Imai
patent: 6633627 (2003-10-01), Horiuchi
patent: 7433444 (2008-10-01), Baumann et al.
patent: 7440542 (2008-10-01), Baumann et al.
patent: 7453981 (2008-11-01), Baumann et al.
patent: 7486770 (2009-02-01), Baumann et al.
patent: 7492871 (2009-02-01), Popescu et al.
patent: 7522698 (2009-04-01), Popescu et al.
patent: 7522708 (2009-04-01), Heismann et al.
patent: 7535986 (2009-05-01), Hempel
patent: 7564941 (2009-07-01), Baumann et al.
patent: 7639786 (2009-12-01), Baumann et al.
patent: 7646843 (2010-01-01), Popescu et al.
patent: 7746981 (2010-06-01), Takahashi et al.
patent: 7817777 (2010-10-01), Baumann et al.
patent: 7889838 (2011-02-01), David et al.
patent: 7924973 (2011-04-01), Kottler et al.
patent: 200610062487.1 (2007-02-01), None
patent: WO2007/074029 (2007-07-01), None
Engelhardt, et. al, High-Resolution Differential Phase Contrast Imaging Using Microfocus X-ray Sources, International Sumposium on Digital industrial Radiology, 2007, France.

Affiliated with

Also associated with

Rating

Differential interference phase contrast X-ray imaging system does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Differential interference phase contrast X-ray imaging system, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Differential interference phase contrast X-ray imaging system will most certainly appreciate the feedback.

Rate now

Comments { 0 }

Profile ID: LFUS-PAI-O-4314438