Optical: systems and elements – Compound lens system – Microscope
Patent
1994-06-30
1996-11-05
Nguyen, Thong
Optical: systems and elements
Compound lens system
Microscope
359371, 359385, G02B 2106, G02B 2100
Patent
active
055723594
ABSTRACT:
A differential interference microscope which includes a light source, a condenser optical system for condensing beams of light from the light source and illuminating an object with the beams of light, an objective optical system for converging the beams of light from the illuminated object and forming an image of the object, a pick-up device for photoelectrically detecting the image of the object, and a contrast enhancement circuit for enhancing a contrast of the image on the basis of an output signal of the pick-up device. A first polarizing element and a first birefringent element are disposed sequentially in an optical path between the light source and the object. The first polarizing element changes the beams of light from the light source into predetermined beams of polarized light. The first birefringent element separates the polarized light into an ordinary ray and an extraordinary ray. A second birefringent element and a second polarizing element are disposed sequentially in an optical path between the object and the image. The second birefringent element guides the two light beams from the object onto the same optical path. The second polarizing element causes the two light beams guided onto the same optical path to interfere with each other. The shear quantity S between the ordinary ray and the extraordinary ray satisfies the following condition:
REFERENCES:
patent: 3561876 (1971-02-01), Hoffman
patent: 4412246 (1983-10-01), Allen et al.
patent: 4795246 (1989-01-01), Lord
patent: 4964707 (1990-10-01), Hayashi
patent: 5280387 (1994-01-01), Maruyama
Ryoko Technical Report, vol. 27, No. 319, Aug. 1, 1990.
M. Pluta, Variable Phase-Contrast and Interference Microscopy, OPTIK, vol. 39, No. 2, 1973, pp. 126-133.
Kawahito Takashi
Otaki Tatsuro
Nguyen Thong
Nikon Corporation
LandOfFree
Differential interference microscope apparatus and an observing does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with Differential interference microscope apparatus and an observing , we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Differential interference microscope apparatus and an observing will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-2019299