Dynamic information storage or retrieval – Specific detail of information handling portion of system – Electrical modification or sensing of storage medium
Reexamination Certificate
2007-06-05
2007-06-05
Neyzari, Ali (Department: 2627)
Dynamic information storage or retrieval
Specific detail of information handling portion of system
Electrical modification or sensing of storage medium
Reexamination Certificate
active
10657715
ABSTRACT:
A dielectric recording/reproducing apparatus is provided with: a probe for applying an electric field to a dielectric material; a return electrode for returning the high frequency electric field for data reproduction; an inductor placed between the probe and the return electrode; an oscillator which oscillates at a resonance frequency determined according to the inductor and a capacitance formed in the dielectric material just under the probe; a switch for switching circuit connections depending on whether data recording is performed and data reproducing is performed; a recording signal input device for converting data to be recorded to generate a recording signal; a direct current voltage generation device for generating a direct current bias voltage to be applied to the dielectric material; a frequency-amplitude demodulator for demodulating an oscillation signal of the oscillator having the frequency that is changed depending on the capacitance owned by the dielectric material just under the probe; and a signal detector for detecting data from the demodulated signal.
REFERENCES:
patent: 4320491 (1982-03-01), Rustman
patent: 4489278 (1984-12-01), Sawazaki et al.
patent: 5418029 (1995-05-01), Yamamoto et al.
patent: 5481527 (1996-01-01), Kasanuki et al.
patent: 5488602 (1996-01-01), Yamano et al.
patent: 5646932 (1997-07-01), Kuribayashi et al.
patent: 5751685 (1998-05-01), Yi
patent: 5777977 (1998-07-01), Fujiwara et al.
patent: 5808977 (1998-09-01), Koyanagi et al.
patent: 5914920 (1999-06-01), Yokogawa
patent: 5946284 (1999-08-01), Chung et al.
patent: 5985404 (1999-11-01), Yano et al.
patent: 6197989 (2001-03-01), Furukawa et al.
patent: 6477132 (2002-11-01), Azuma et al.
patent: 6510130 (2003-01-01), Hayashi et al.
patent: 6515957 (2003-02-01), Newns et al.
patent: 6653630 (2003-11-01), Rosenman et al.
patent: 6762402 (2004-07-01), Choi et al.
patent: 6841220 (2005-01-01), Onoe et al.
patent: 6912193 (2005-06-01), Cho et al.
patent: 6965545 (2005-11-01), Hino et al.
patent: 7065033 (2006-06-01), Onoe et al.
patent: 7149180 (2006-12-01), Onoe et al.
patent: 2002/0105249 (2002-08-01), Yoshida et al.
patent: 2002/0118906 (2002-08-01), Onoe
patent: 2002/0131669 (2002-09-01), Onoe et al.
patent: 2003/0021213 (2003-01-01), Hagiwara
patent: 2003/0053400 (2003-03-01), Cho et al.
patent: 2004/0027935 (2004-02-01), Cho et al.
patent: 2004/0042351 (2004-03-01), Onoe et al.
patent: 2004/0090903 (2004-05-01), Cho et al.
patent: 2004/0105373 (2004-06-01), Maeda et al.
patent: 2004/0105380 (2004-06-01), Cho et al.
patent: 2004/0114913 (2004-06-01), Kume
patent: 2004/0246879 (2004-12-01), Onoe et al.
patent: 2004/0252621 (2004-12-01), Cho et al.
patent: 2004/0263185 (2004-12-01), Cho et al.
patent: 2005/0047288 (2005-03-01), Maeda et al.
patent: 2005/0098532 (2005-05-01), Onoe et al.
patent: 2005/0099895 (2005-05-01), Maeda et al.
patent: 2005/0122886 (2005-06-01), Takahashi et al.
patent: 1 369 864 (2003-12-01), None
patent: 1 381 042 (2004-01-01), None
patent: 1 484 256 (1977-09-01), None
patent: 56-107338 (1981-08-01), None
patent: 57-200956 (1982-12-01), None
patent: 08-075806 (1996-03-01), None
patent: 09-097457 (1997-04-01), None
patent: 09-153235 (1997-06-01), None
patent: 10-334525 (1998-12-01), None
patent: 2003085969 (2003-03-01), None
62th Japan Society of Applied Physics Lecture Meeting (2001.9 Aichi Institute of Technology) 12p-ZR-2.
Kazuta et al, “Determination of crystal polarities of piezoelectric thin film using scanning nonlinear dielectric microscopy”, Journal of European Ceramic Society 21 (2001) 1581-1584.
The Institution of Electrical Engineers, Stevenage, GB; Jun. 1, 2002; Hiranaga et al, “Nano-sized domain formation in stoichiometric LiTaO/sub3/single crystal using Scanning Nonlinear Dielectric Microscopy”, XP002292217.
Cho et al, “Scanning nonlinear dielectric microscopy with nanometer resolution”, Journal of European Ceramic Society 21 (2001) 2131-2134.
Cho et al., Nano domain engineering using scanning nonlinear dielectric microscopy, Oct. 29, 2001, IEE-NANO 2001, pp. 352-357.
Hiranaga et al, “Nano-Sized Inverted Domain Formation in Stoichiometric Lita03 Single Crystal Using Scanning Nonlinear Dielectric Microscopy”, Integrated Ferroelectrics, New York, NY, vol. 49, May 1, 2002, pp. 203-209, XP009035260.
Cho Yasuo
Onoe Atsushi
Cho Yasuo
Neyzari Ali
Nixon & Vanderhye PC
Pioneer Corporation
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