Dielectric recording apparatus, dielectric reproducing...

Dynamic information storage or retrieval – Specific detail of information handling portion of system – Electrical modification or sensing of storage medium

Reexamination Certificate

Rate now

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Details

Reexamination Certificate

active

10657715

ABSTRACT:
A dielectric recording/reproducing apparatus is provided with: a probe for applying an electric field to a dielectric material; a return electrode for returning the high frequency electric field for data reproduction; an inductor placed between the probe and the return electrode; an oscillator which oscillates at a resonance frequency determined according to the inductor and a capacitance formed in the dielectric material just under the probe; a switch for switching circuit connections depending on whether data recording is performed and data reproducing is performed; a recording signal input device for converting data to be recorded to generate a recording signal; a direct current voltage generation device for generating a direct current bias voltage to be applied to the dielectric material; a frequency-amplitude demodulator for demodulating an oscillation signal of the oscillator having the frequency that is changed depending on the capacitance owned by the dielectric material just under the probe; and a signal detector for detecting data from the demodulated signal.

REFERENCES:
patent: 4320491 (1982-03-01), Rustman
patent: 4489278 (1984-12-01), Sawazaki et al.
patent: 5418029 (1995-05-01), Yamamoto et al.
patent: 5481527 (1996-01-01), Kasanuki et al.
patent: 5488602 (1996-01-01), Yamano et al.
patent: 5646932 (1997-07-01), Kuribayashi et al.
patent: 5751685 (1998-05-01), Yi
patent: 5777977 (1998-07-01), Fujiwara et al.
patent: 5808977 (1998-09-01), Koyanagi et al.
patent: 5914920 (1999-06-01), Yokogawa
patent: 5946284 (1999-08-01), Chung et al.
patent: 5985404 (1999-11-01), Yano et al.
patent: 6197989 (2001-03-01), Furukawa et al.
patent: 6477132 (2002-11-01), Azuma et al.
patent: 6510130 (2003-01-01), Hayashi et al.
patent: 6515957 (2003-02-01), Newns et al.
patent: 6653630 (2003-11-01), Rosenman et al.
patent: 6762402 (2004-07-01), Choi et al.
patent: 6841220 (2005-01-01), Onoe et al.
patent: 6912193 (2005-06-01), Cho et al.
patent: 6965545 (2005-11-01), Hino et al.
patent: 7065033 (2006-06-01), Onoe et al.
patent: 7149180 (2006-12-01), Onoe et al.
patent: 2002/0105249 (2002-08-01), Yoshida et al.
patent: 2002/0118906 (2002-08-01), Onoe
patent: 2002/0131669 (2002-09-01), Onoe et al.
patent: 2003/0021213 (2003-01-01), Hagiwara
patent: 2003/0053400 (2003-03-01), Cho et al.
patent: 2004/0027935 (2004-02-01), Cho et al.
patent: 2004/0042351 (2004-03-01), Onoe et al.
patent: 2004/0090903 (2004-05-01), Cho et al.
patent: 2004/0105373 (2004-06-01), Maeda et al.
patent: 2004/0105380 (2004-06-01), Cho et al.
patent: 2004/0114913 (2004-06-01), Kume
patent: 2004/0246879 (2004-12-01), Onoe et al.
patent: 2004/0252621 (2004-12-01), Cho et al.
patent: 2004/0263185 (2004-12-01), Cho et al.
patent: 2005/0047288 (2005-03-01), Maeda et al.
patent: 2005/0098532 (2005-05-01), Onoe et al.
patent: 2005/0099895 (2005-05-01), Maeda et al.
patent: 2005/0122886 (2005-06-01), Takahashi et al.
patent: 1 369 864 (2003-12-01), None
patent: 1 381 042 (2004-01-01), None
patent: 1 484 256 (1977-09-01), None
patent: 56-107338 (1981-08-01), None
patent: 57-200956 (1982-12-01), None
patent: 08-075806 (1996-03-01), None
patent: 09-097457 (1997-04-01), None
patent: 09-153235 (1997-06-01), None
patent: 10-334525 (1998-12-01), None
patent: 2003085969 (2003-03-01), None
62th Japan Society of Applied Physics Lecture Meeting (2001.9 Aichi Institute of Technology) 12p-ZR-2.
Kazuta et al, “Determination of crystal polarities of piezoelectric thin film using scanning nonlinear dielectric microscopy”, Journal of European Ceramic Society 21 (2001) 1581-1584.
The Institution of Electrical Engineers, Stevenage, GB; Jun. 1, 2002; Hiranaga et al, “Nano-sized domain formation in stoichiometric LiTaO/sub3/single crystal using Scanning Nonlinear Dielectric Microscopy”, XP002292217.
Cho et al, “Scanning nonlinear dielectric microscopy with nanometer resolution”, Journal of European Ceramic Society 21 (2001) 2131-2134.
Cho et al., Nano domain engineering using scanning nonlinear dielectric microscopy, Oct. 29, 2001, IEE-NANO 2001, pp. 352-357.
Hiranaga et al, “Nano-Sized Inverted Domain Formation in Stoichiometric Lita03 Single Crystal Using Scanning Nonlinear Dielectric Microscopy”, Integrated Ferroelectrics, New York, NY, vol. 49, May 1, 2002, pp. 203-209, XP009035260.

LandOfFree

Say what you really think

Search LandOfFree.com for the USA inventors and patents. Rate them and share your experience with other people.

Rating

Dielectric recording apparatus, dielectric reproducing... does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Dielectric recording apparatus, dielectric reproducing..., we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Dielectric recording apparatus, dielectric reproducing... will most certainly appreciate the feedback.

Rate now

     

Profile ID: LFUS-PAI-O-3859564

  Search
All data on this website is collected from public sources. Our data reflects the most accurate information available at the time of publication.