Dielectric dispersion determining method in terahertz region usi

Details Dielectric dispersion determining method in terahertz region usi Dielectric dispersion determining method in terahertz region usi

1998-03-10

1999-08-31

Kim, Robert H.

Optics: measuring and testing

Refraction testing

G01N 2141

Patent

active

059460857

ABSTRACT:
A dielectric dispersion determining method applying a transient grating method. The transient response of a sample is observed by the transient grating method using a femtosecond ultrashort visible optical pulse. A vibrational waveform b(t) is determined such that its square b(t).sup.2 replicates vibrational components observed in the transient response. The vibrational waveform b(t) is converted into b(.omega.) through the Fourier transform. The dielectric constant .epsilon.(.omega.) is obtained by substituting the converted value for b(.omega.)/.omega..sup.2 on the right-hand side of the following equation (1) derived from Maxwell's equations. The dielectric constant and/or refraction index can be directly obtained from the transient response to the femtosecond ultrashort visible optical pulse without passing through the dispersion relation which leaves some ambiguity in its definition. ##EQU1##

REFERENCES:
patent: 5604581 (1997-02-01), Liu et al.

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