Dynamic information storage or retrieval – Specific detail of information handling portion of system – Electrical modification or sensing of storage medium
Reexamination Certificate
2007-05-15
2007-05-15
Edun, Muhammad (Department: 2627)
Dynamic information storage or retrieval
Specific detail of information handling portion of system
Electrical modification or sensing of storage medium
C369S100000
Reexamination Certificate
active
10489170
ABSTRACT:
A dielectric constant measuring apparatus for measuring a dielectric constant of a dielectric substance is provided with: a cantilever having a small projection on a tip side of a cantilevered electric conductor; an electrode which is placed around the cantilever and is earthed; an inductor (L) placed so as to constitute a resonance circuit together with a capacitance (Cs) in a small area of the dielectric substance that the cantilever contacts; an oscillating device connected to the resonance circuit; a demodulating device for demodulating an oscillation frequency of the oscillating device; and a dielectric constant detecting device for detecting a dielectric constant information from a demodulation signal of the demodulating. The dielectric constant measuring apparatus can be applied to an information recording/reproducing apparatus using a dielectric record medium.
REFERENCES:
patent: 2872529 (1959-02-01), Hollmann et al.
patent: 4320491 (1982-03-01), Rustman
patent: 4455638 (1984-06-01), Wilson
patent: 4489278 (1984-12-01), Sawazaki
patent: 5418029 (1995-05-01), Yamamoto et al.
patent: 5481527 (1996-01-01), Kasanuki et al.
patent: 5488602 (1996-01-01), Yamano et al.
patent: 5646932 (1997-07-01), Kuribayashi et al.
patent: 5751685 (1998-05-01), Yi
patent: 5777977 (1998-07-01), Fujiwara et al.
patent: 5808977 (1998-09-01), Koyanagi et al.
patent: 5914920 (1999-06-01), Yokogawa
patent: 5946284 (1999-08-01), Chung et al.
patent: 5985404 (1999-11-01), Yano et al.
patent: 6197989 (2001-03-01), Furukawa et al.
patent: 6477132 (2002-11-01), Azuma et al.
patent: 6510130 (2003-01-01), Hayashi et al.
patent: 6515957 (2003-02-01), Newns et al.
patent: 6653630 (2003-11-01), Rosenman et al.
patent: 6762402 (2004-07-01), Choi et al.
patent: 6841220 (2005-01-01), Onoe et al.
patent: 6912193 (2005-06-01), Cho et al.
patent: 6965545 (2005-11-01), Hino et al.
patent: 7065033 (2006-06-01), Onoe et al.
patent: 7149180 (2006-12-01), Onoe et al.
patent: 2002/0105249 (2002-08-01), Yoshida et al.
patent: 2002/0118906 (2002-08-01), Onoe
patent: 2002/0131669 (2002-09-01), Onoe et al.
patent: 2003/0021213 (2003-01-01), Hagiwara
patent: 2003/0053400 (2003-03-01), Cho et al.
patent: 2004/0027935 (2004-02-01), Cho et al.
patent: 2004/0042351 (2004-03-01), Onoe et al.
patent: 2004/0090903 (2004-05-01), Cho et al.
patent: 2004/0105373 (2004-06-01), Maeda et al.
patent: 2004/0105380 (2004-06-01), Cho et al.
patent: 2004/0114913 (2004-06-01), Kume
patent: 2004/0252621 (2004-12-01), Cho et al.
patent: 2004/0263185 (2004-12-01), Cho et al.
patent: 2005/0047288 (2005-03-01), Maeda et al.
patent: 2005/0098532 (2005-05-01), Onoe et al.
patent: 2005/0099895 (2005-05-01), Maeda et al.
patent: 2005/0122886 (2005-06-01), Takahashi et al.
patent: 644 426 (1950-10-01), None
patent: 1 484 256 (1977-09-01), None
patent: 56-107338 (1981-08-01), None
patent: 57-200956 (1982-12-01), None
patent: 08-075806 (1996-03-01), None
patent: 10-334525 (1998-12-01), None
patent: 2003085969 (2003-03-01), None
Patent Abstracts of Japan, vol. 1996, No. 07, Jul. 31, 1996 & JP 08 075806 A, Mar. 22, 1996.
Patent Abstracts of Japan, vol. 0051, No. 13, Nov. 13, 1981 & JP 56 107338 A, Aug. 26, 1981.
62th Japan Society of Applied Physics Lecture Meeting (2001.9 Aichi Institute of Technology) 12p-ZR-2.
Kazuta et al, “Determination of crystal polarities of piezoelectric thin film using scanning nonlinear dielectric microscopy”, Journal of European Ceramic Society 21 (2001) 1581-1584.
The Institution of Electrical Engineers, Stevenage, GB; Jun. 1, 2002; Hiranaga et al, “Nano-sized in inverted domain formation in stoichiometric LiTaO/sub3/single crystal using Scanning Nonlinear Dielectric Microscopy”, XP002292217.
Cho et al, “Scanning nonlinear dielectric microscopy with nanometer resolution”, Journal of European Ceramic Society 21 (2001) 2131-2134.
Cho et al., Nano domain engineering using scanning nonlinear dielectric microscopy, Oct. 29, 2001, IEE-NANO 2001, pp. 352-357.
Cho Yasuo
Onoe Atsushi
Cho Yasuo
Edun Muhammad
Nixon & Vanderhye PC
Pioneer Corporation
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