Electricity: measuring and testing – Impedance – admittance or other quantities representative of... – Lumped type parameters
Patent
1993-05-11
1994-09-06
Regan, Maura K.
Electricity: measuring and testing
Impedance, admittance or other quantities representative of...
Lumped type parameters
324444, G01R 2726
Patent
active
053451830
ABSTRACT:
Important portions for measurements such as measurement of a peak value can be measured with a substantially constant accuracy, by making an applied sinusoidal wave variable. An amplitude adjuster is disposed behind a sinusoidal wave generator. A sinusoidal wave applied to a voltage electrode is variable. An electrical current induced in a current electrode according to the nature of a sample is fed to an arithmetic portion via a current detector, a peak value-measuring device, and an A/D converter. The arithmetic portion performs a calculation. Then, an amplitude applied to the voltage electrode is determined and adjusted by the amplitude adjuster.
REFERENCES:
patent: 3757205 (1973-09-01), Dauphinee
patent: 4808931 (1989-02-01), Ling
patent: 5134380 (1992-07-01), Jones
patent: 5177445 (1993-01-01), Cross
patent: 5272444 (1993-12-01), Cox
Third International Conference on Dielectric Materials Measurements and Applications Birmingham, England (Sep. 10-13, 1979), Noyd et al.
Regan Maura K.
Seiko Instruments Inc.
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