Electricity: measuring and testing – Impedance – admittance or other quantities representative of... – Lumped type parameters
Reexamination Certificate
2005-03-29
2005-03-29
Zarneke, David (Department: 2829)
Electricity: measuring and testing
Impedance, admittance or other quantities representative of...
Lumped type parameters
Reexamination Certificate
active
06873176
ABSTRACT:
A die-level prober testing an unpackaged liquid crystal on silicon (LCOS) display panel includes a tray and a probe card. The unpackaged LCOS display panel has at least a first contact pad and a second contact pad. Additionally, the tray includes at least a recession for situating the unpackaged LCOS display panel, and a conductive connecting structure electrically contacting the first contact pad. The probe card is utilized to electrically contact the connecting structure and the second contact pad for testing the unpackaged LCOS display panel.
REFERENCES:
patent: 6498636 (2002-12-01), Mathew et al.
patent: 6664864 (2003-12-01), Jiles et al.
Hsu Tung-Jung
Liu Sung-Pin
Yang Chuang-Ming
Yeh Chi-Hone
Hsu Winston
Nguyen Trung Q.
United Microelectronics Corp.
Zarneke David
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