Electricity: measuring and testing – Fault detecting in electric circuits and of electric components – Of individual circuit component or element
Reexamination Certificate
2005-02-22
2005-02-22
Tang, Minh N. (Department: 2829)
Electricity: measuring and testing
Fault detecting in electric circuits and of electric components
Of individual circuit component or element
C324S765010
Reexamination Certificate
active
06859057
ABSTRACT:
A die carrier is disclosed which is specifically designed for use in a TSOP socket. More specifically, the die carrier has a carrier substrate with carrier contacts thereon that are dimensioned specifically to match the positioning of the upper and lower socket contacts. The carrier substrate, being 145 microns thick, can also fit between the upper and lower socket contacts. A carrier base support component is located below a portion only of the carrier substrate, and does not impair insertion of the carrier substrate into the relatively small spacing between the upper and lower socket contacts. Damage to the carrier substrate is avoided by clamping edges of the carrier substrate from opposing sides between the upper and lower socket contacts. There are no screws or nuts within the carrier base support component that may increase its size and prevent it from being inserted into the socket.
REFERENCES:
patent: 5517125 (1996-05-01), Posedel et al.
patent: 5519332 (1996-05-01), Wood et al.
patent: 5705933 (1998-01-01), Lim et al.
patent: 5731709 (1998-03-01), Pastore et al.
patent: 6025732 (2000-02-01), Foo et al.
patent: 6072326 (2000-06-01), Akram et al.
Hemmerling Martin A.
Malathong Seang P.
Aehr Test Systems
De Klerk Stephen M.
Tang Minh N.
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