Semiconductor device manufacturing: process – Making device or circuit emissive of nonelectrical signal – Substrate dicing
Reexamination Certificate
2011-03-08
2011-03-08
Landau, Matthew C (Department: 2813)
Semiconductor device manufacturing: process
Making device or circuit emissive of nonelectrical signal
Substrate dicing
C438S068000, C438S113000, C438S114000, C438S458000
Reexamination Certificate
active
07901967
ABSTRACT:
A method for dicing a semiconductor substrate includes: forming a reforming layer in the substrate by irradiating a laser beam on the substrate; forming a groove on the substrate along with a cutting line; and applying a force to the substrate in order to cutting the substrate at the reforming layer as a starting point of cutting. The groove has a predetermined depth so that the groove is disposed near the reforming layer, and the force provides a stress at the groove.
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Fujii Tetsuo
Funato Hirotsugu
Kohno Kenji
Komura Atsushi
Maruyama Yumi
Denso Corporation
Landau Matthew C
Mitchell James M
Posz Law Group , PLC
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