Diaphragm test probe

Details Diaphragm test probe Diaphragm test probe

1988-11-30

1990-11-20

Eisenzopf, Reinhard J.

Electricity: measuring and testing

Measuring, testing, or sensing electricity, per se

With rotor

324 725, 324158P, G01R 102, G01R 104

Patent

active

049721437

ABSTRACT:
A diaphragm test probe for establishing a detachable electrical connection to the pads on an integrated circuit chip. Leads are electrically connected to a plurality of conductive contacts which are affixed to a flexible diaphragm. The conductive contacts are arranged to match the pattern of the pads on the integrated circuit chip and are aligned with these pads using visual sighting. After alignment, fluidic pressure is applied to the flexible diaphragm, causing it to flex and, in turn, the conductive contacts to make electrical contact with the pads on the integrated circuit. A plurality of sets of conductive contacts may be affixed to a single flexible diaphragm so as to allow multiple chip testing without realignment of the test probe.

REFERENCES:
patent: 3596228 (1971-07-01), Reed et al.
patent: 3832632 (1974-08-01), Ardezzone
patent: 4566184 (1986-01-01), Higgins et al.
patent: 4636722 (1987-01-01), Ardezzone
patent: 4649339 (1987-03-01), Grangroth et al.
patent: 4686463 (1987-08-01), Logan
patent: 4791363 (1988-12-01), Logan
patent: 4820976 (1989-04-01), Brown
patent: 4922192 (1990-05-01), Gross et al.

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